一、內容
本課程介紹積體電路系統測試之觀念及技術，內容包含可測試性設計（Design-for-
Test）、內建自我測試（Built-In Self-Test）、記憶體測試、類比/混模電路測試及系統晶
片測試技術，適合對VLSI設計與測試有興趣的同學修習。
1. Digital circuit testing
A brief review of fault modeling, fault simulation, and automatic test pattern
generation (ATPG) techniques for digital circuits.
2. Digital circuit DfT and BIST techniques
Systematic and ad hoc DfT and BIST techniques for digital circuits.
3. Memory testing, DfT, and BIST techniques
After test-related memory design issues are discussed, fault modeling, testing,
DfT, and BIST techniques for various memory designs will be covered.
4. Analog/mixed-signal testing techniques
In this part, AMS testing basics, DSP-based testing, ADC/DAC testing, high-speed
serial link testing will be covered.
5. System-level testing
Core-based SoC testing and IEEE P1500 will be introduced followed by SoC test
scheduling.
二、教科書
以上課講義為主，參考書目為：
1. M.L. Bushnell, V.D. Agrawal, 。?Essentials of Electronic Testing,。? Kluwer
Academic Publishers, 2000.
2. R. Dean Adams, 。?High Performance Memory Testing,。? Kluwer Academic
Publishers, 2003.
3. M. Burns and G. W. Roberts, 。?An Introduction to Mixed-Signal IC Test and
Measurement,。? Oxford, 2001.
三、成績評量方式
Homework: 30% / Exam: 40% / Term Project: 30%
四、預修課程:
邏輯電路設計、電子學